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Your search returned 3 results.

1.
Scanning electron microscopy and x-ray microanalysis (with CD)

by Goldstein, Joseph I | Newbury, Dale E | Echlin, Patrick | Joy, David C | Lyman, Charles E | Lifshin, Eric | Sawyer, Linda | Michael, Joseph R.

Edition: 3rd ed. Language: English Publisher: New York Springer 2003Availability: Items available for loan: Central Library [Call number: 502.825 GOL/S] (1). Items available for reference: Central Library [Call number: 502.825 GOL/S] (1).
Place hold
2.
Materials characterization: introduction to microscopic and spectroscopic methods

by Leng, Yang.

Edition: 2nd ed. Language: English Publisher: Germany Wiley-VCH 2013Availability: Items available for loan: Central Library [Call number: 535.84 LEN/M] (3).
Place hold
3.
Physical principles of electron microscopy: an introduction to TEM, SEM and AEM

by Egerton, R. F.

Edition: 2nd ed. Language: English Publisher: Switzerland Springer 2016Availability: Items available for loan: Central Library [Call number: 502.825 EGE/P] (3). Items available for reference: Central Library [Call number: 502.825 EGE/P] (1).
Place hold

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