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Physical principles of electron microscopy: an introduction to TEM, SEM and AEM

By: Egerton, R. F
Language: English Publisher: Switzerland Springer 2016Edition: 2nd edDescription: xi, 196pISBN: 9783319398761Subject(s): Transmission electron microscope | Scanning electron microscope | Analytical electron microscopyDDC classification: 502.825 EGE/P
Item type Current location Collection Call number Status Date due Barcode
Book Book Central Library
General Stack (Sahyadri Campus) 		502.825 EGE/P Available 05083
Book Book Central Library
General Stack (Sahyadri Campus) 		502.825 EGE/P Available 05084
Reference Reference Central Library
Reference (Sahyadri Campus) 		Reference 502.825 EGE/P Not for loan 04075
Book Book Central Library
General Stack (Sahyadri Campus) 		502.825 EGE/P Available 04076

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