Koha online

HTML5 Icon

Scanning electron microscopy and x-ray microanalysis (with CD)

By: Goldstein, Joseph I
Contributor(s): Newbury, Dale E | Echlin, Patrick | Joy, David C | Lyman, Charles E | Lifshin, Eric | Sawyer, Linda | Michael, Joseph R
Language: English Publisher: New York Springer 2003Edition: 3rd edDescription: xix, 690p. CD-ROMISBN: 9780306472923Subject(s): Scanning electron microscopy | X-ray microanalysisDDC classification: 502.825 GOL/S
Item type Current location Collection Call number Status Date due Barcode
Reference Reference Central Library
Reference (Sahyadri Campus) 		Reference 502.825 GOL/S Not for loan 04968
Book Book Central Library
General Stack (Sahyadri Campus) 		502.825 GOL/S Available 04969

Imp. Notice: It is hereby requested to all the library users to very carefully use the library resources. If the library resources are not found in good condition while returning to the library, the Central Library will not accept the damaged items and a fresh copy of the same should be replaced by the user. Marking/ highlighting on library books with pencil or ink, scribbling, tearing the pages or spoiling the same in any other way will be considered damaged.