000
00265nam a2200109Ia 4500
008
241018s9999 xx 000 0 und d
020
_a
9780792305361
100
_a
A. Christou
_9
9980
245
0
_a
Semiconductor device reliability
260
_b
Springer
260
_c
1989
999
_c
3272
_d
3272