Physical principles of electron microscopy: an introduction to TEM, SEM and AEM
By: Egerton, R. F
Language: English Publisher: Switzerland Springer 2016Edition: 2nd edDescription: xi, 196pISBN: 9783319398761Subject(s): Transmission electron microscope | Scanning electron microscope | Analytical electron microscopyDDC classification: 502.825 EGE/PItem type | Current location | Collection | Call number | Status | Date due | Barcode |
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Book | Central Library General Stack (Sahyadri Campus) | 502.825 EGE/P | Available | 05083 | ||
Book | Central Library General Stack (Sahyadri Campus) | 502.825 EGE/P | Available | 05084 | ||
Reference | Central Library Reference (Sahyadri Campus) | Reference | 502.825 EGE/P | Not for loan | 04075 | |
Book | Central Library General Stack (Sahyadri Campus) | 502.825 EGE/P | Available | 04076 |