Scanning electron microscopy and x-ray microanalysis (with CD)
By: Goldstein, Joseph I
Contributor(s): Newbury, Dale E | Echlin, Patrick | Joy, David C | Lyman, Charles E | Lifshin, Eric | Sawyer, Linda | Michael, Joseph R
Language: English Publisher: New York Springer 2003Edition: 3rd edDescription: xix, 690p. CD-ROMISBN: 9780306472923Subject(s): Scanning electron microscopy | X-ray microanalysisDDC classification: 502.825 GOL/SItem type | Current location | Collection | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Reference | Central Library Reference (Sahyadri Campus) | Reference | 502.825 GOL/S | Not for loan | 04968 | |
Book | Central Library General Stack (Sahyadri Campus) | 502.825 GOL/S | Available | 04969 |