TY  - GEN
AU  - Brandon, David
AU  - Kaplan, Wayne D. 
TI  - Microstructural characterization of materials 
SN  - 9780470027851
U1  - 620.11299 BRA/M 
PY  - 2008///
CY  - Chichester
PB  - John Wiley & Sons
KW  - Materials-Microscopy
KW  - Microstructure
ER  -