Egerton, R. F. <br/><br/>
Physical principles of electron microscopy: an introduction to TEM, SEM and AEM 

 - 2nd ed. 
 - Switzerland  Springer  2016 
 - xi, 196p. 
<br/><br/><label>ISBN: </label>9783319398761 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Transmission electron microscope<br/>Scanning electron microscope<br/>Analytical electron microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825 EGE/P