TY  - GEN
AU  - Goldstein, Joseph I.
AU  - Newbury,  Dale E.  
AU  - Echlin, Patrick 
AU  - Joy,  David C.
AU  - Lyman, Charles E.
AU  - Lifshin, Eric
AU  - Sawyer, Linda
AU  - Michael, Joseph R.
TI  - Scanning electron microscopy and x-ray microanalysis (with CD)
SN  - 9780306472923
U1  - 502.825 GOL/S 
PY  - 2003///
CY  - New York
PB  - Springer 
KW  - Scanning electron microscopy.
KW  - X-ray microanalysis
ER  -